APA (7th ed.) Citation

Shao, Y., Xu, Z., Chen, J., Lu, J., & Shen, W. (2026). Enhanced pallet detection in complex environments: An AM-Mask R-CNN method. International Journal of Computer Integrated Manufacturing, 39(6), 865. https://doi.org/10.1080/0951192X.2025.2501587

Chicago Style (17th ed.) Citation

Shao, Yiping, Zhilong Xu, Jun Chen, Jiansha Lu, and Wenguang Shen. "Enhanced Pallet Detection in Complex Environments: An AM-Mask R-CNN Method." International Journal of Computer Integrated Manufacturing 39, no. 6 (2026): 865. https://doi.org/10.1080/0951192X.2025.2501587.

MLA (9th ed.) Citation

Shao, Yiping, et al. "Enhanced Pallet Detection in Complex Environments: An AM-Mask R-CNN Method." International Journal of Computer Integrated Manufacturing, vol. 39, no. 6, 2026, p. 865, https://doi.org/10.1080/0951192X.2025.2501587.