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An efficient parallel approach for binary-state network reliability problems.

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Bibliographic Details
Title: An efficient parallel approach for binary-state network reliability problems.
Authors: Yeh, Wei-Chang1, yeh@ieee.org, Forghani-elahabad, Majid2, m.forghani@ufabc.edu.br
Source: Annals of Operations Research; Jun2026, Vol. 361 Issue 3, p1091-1112, 22p
Database: Applied Science & Technology Source
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ISSN:02545330
DOI:10.1007/s10479-024-06409-3