Bibliographic Details
| Title: |
An In‐Line Machine Vision–Based Profilometry Tool for Non‐Destructive Thickness Assessment of Perovskite Films. |
| Authors: |
Velásquez, Juan Pablo1, juan.velasquez25@udea.edu.co, Patiño, Juan José1, Jimenez, Keony1, Mesa, Santiago1, Perez, Milton1, Parvazian, Ershad2, Ramírez, Edwin Alexander1, Betancur, Rafael1, Watson, Trystan2, Jaramillo, Franklin1, franklin.jaramillo@udea.edu.co |
| Source: |
Advanced Electronic Materials; 6/8/2026, Vol. 12 Issue 11, p1-13, 13p |
| Database: |
Applied Science & Technology Source |
