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An In‐Line Machine Vision–Based Profilometry Tool for Non‐Destructive Thickness Assessment of Perovskite Films.

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Title: An In‐Line Machine Vision–Based Profilometry Tool for Non‐Destructive Thickness Assessment of Perovskite Films.
Authors: Velásquez, Juan Pablo1, juan.velasquez25@udea.edu.co, Patiño, Juan José1, Jimenez, Keony1, Mesa, Santiago1, Perez, Milton1, Parvazian, Ershad2, Ramírez, Edwin Alexander1, Betancur, Rafael1, Watson, Trystan2, Jaramillo, Franklin1, franklin.jaramillo@udea.edu.co
Source: Advanced Electronic Materials; 6/8/2026, Vol. 12 Issue 11, p1-13, 13p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 194490751
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PubType: Academic Journal
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  Data: An In‐Line Machine Vision–Based Profilometry Tool for Non‐Destructive Thickness Assessment of Perovskite Films.
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Electronic+Materials%22">Advanced Electronic Materials</searchLink>; 6/8/2026, Vol. 12 Issue 11, p1-13, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194490751
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        Value: 10.1002/aelm.202500877
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        Text: English
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              Text: 6/8/2026
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