Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.

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Bibliographic Details
Title: Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.
Authors: Jiang-Li Cao1, Cao@physik.rwth-aachen.de, Solbach, Axel2, Klemradt, Uwe2, Weirich, Thomas3, Mayer, Joachim3, Böttger, Ulrich4, Ellerkmann, Ulrich4, Schorn, Peter J.4, Gerber, Peter4, Waser, Rainer4
Source: Journal of the American Ceramic Society; Apr2006, Vol. 89 Issue 4, p1321-1325, 5p, 2 Black and White Photographs, 1 Chart, 2 Graphs
Database: Applied Science & Technology Source
Description
ISSN:00027820
DOI:10.1111/j.1551-2916.2005.00885.x