Cao, J., Solbach, A., Klemradt, U., Weirich, T., Mayer, J., Böttger, U., . . . Waser, R. (2006). Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films. Journal of the American Ceramic Society, 89(4), 1321. https://doi.org/10.1111/j.1551-2916.2005.00885.x
Chicago Style (17th ed.) CitationCao, Jiang-Li, et al. "Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films." Journal of the American Ceramic Society 89, no. 4 (2006): 1321. https://doi.org/10.1111/j.1551-2916.2005.00885.x.
MLA (9th ed.) CitationCao, Jiang-Li, et al. "Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films." Journal of the American Ceramic Society, vol. 89, no. 4, 2006, p. 1321, https://doi.org/10.1111/j.1551-2916.2005.00885.x.