Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.
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| Title: | Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films. |
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| Authors: | Jiang-Li Cao1, Cao@physik.rwth-aachen.de, Solbach, Axel2, Klemradt, Uwe2, Weirich, Thomas3, Mayer, Joachim3, Böttger, Ulrich4, Ellerkmann, Ulrich4, Schorn, Peter J.4, Gerber, Peter4, Waser, Rainer4 |
| Source: | Journal of the American Ceramic Society; Apr2006, Vol. 89 Issue 4, p1321-1325, 5p, 2 Black and White Photographs, 1 Chart, 2 Graphs |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 20238364 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=20238364 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1111/j.1551-2916.2005.00885.x Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 1321 Titles: – TitleFull: Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jiang-Li Cao – PersonEntity: Name: NameFull: Solbach, Axel – PersonEntity: Name: NameFull: Klemradt, Uwe – PersonEntity: Name: NameFull: Weirich, Thomas – PersonEntity: Name: NameFull: Mayer, Joachim – PersonEntity: Name: NameFull: Böttger, Ulrich – PersonEntity: Name: NameFull: Ellerkmann, Ulrich – PersonEntity: Name: NameFull: Schorn, Peter J. – PersonEntity: Name: NameFull: Gerber, Peter – PersonEntity: Name: NameFull: Waser, Rainer IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2006 Type: published Y: 2006 Identifiers: – Type: issn-print Value: 00027820 Numbering: – Type: volume Value: 89 – Type: issue Value: 4 Titles: – TitleFull: Journal of the American Ceramic Society Type: main |
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