APA (7th ed.) Citation

Alvarez, D., Abou-Khalil, M., Russ, C., Chatty, K., Gauthier, R., Kontos, D., . . . Halbach, R. (2006). Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability, 46(9-11), 1597. https://doi.org/10.1016/j.microrel.2006.07.041

Chicago Style (17th ed.) Citation

Alvarez, D., M.J Abou-Khalil, C. Russ, K. Chatty, R. Gauthier, D. Kontos, J. Li, C. Seguin, and R. Halbach. "Analysis of ESD Failure Mechanism in 65nm Bulk CMOS ESD NMOSFETs with ESD Implant." Microelectronics Reliability 46, no. 9-11 (2006): 1597. https://doi.org/10.1016/j.microrel.2006.07.041.

MLA (9th ed.) Citation

Alvarez, D., et al. "Analysis of ESD Failure Mechanism in 65nm Bulk CMOS ESD NMOSFETs with ESD Implant." Microelectronics Reliability, vol. 46, no. 9-11, 2006, p. 1597, https://doi.org/10.1016/j.microrel.2006.07.041.