Simulation study of the noise figure of nanometer-gate nMOS transistors near the scaling limit
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| Title: | Simulation study of the noise figure of nanometer-gate nMOS transistors near the scaling limit |
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| Authors: | Cai, M., mcai@ucsd.edu, Liu, M.1, Taur, Y.1 |
| Source: | Solid-State Electronics; May2007, Vol. 51 Issue 5, p667-673, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00381101 |
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| DOI: | 10.1016/j.sse.2007.02.014 |
