Voltage-induced barrier-layer damage in spin-dependent tunneling junctions.

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Bibliographic Details
Title: Voltage-induced barrier-layer damage in spin-dependent tunneling junctions.
Authors: Rao, D., Sin, K., Gibbons, M., Funada, S., Mao, M., Chien, C., Tong, H.-C.
Source: Journal of Applied Physics; 6/1/2001, Vol. 89 Issue 11, p7362, 3p, 4 Graphs
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.1359228