Structural characterization of cadmium selenide thin films by x-ray diffraction and electron microscopy.

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Bibliographic Details
Title: Structural characterization of cadmium selenide thin films by x-ray diffraction and electron microscopy.
Authors: Pal, U., Samanta, D., Ghorai, S.
Source: Journal of Physics: D Applied Physics; October 14 1992, Vol. 25, p1488-1494, 7p
Database: Applied Science & Technology Source
Description
ISSN:00223727
DOI:10.1088/0022-3727/25/10/014