View in EDS

Structural characterization of cadmium selenide thin films by x-ray diffraction and electron microscopy.

Saved in:
Bibliographic Details
Title: Structural characterization of cadmium selenide thin films by x-ray diffraction and electron microscopy.
Authors: Pal, U., Samanta, D., Ghorai, S.
Source: Journal of Physics: D Applied Physics; October 14 1992, Vol. 25, p1488-1494, 7p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first