Combined wavelength and frequency modulation spectroscopy: a novel diagnostic tool for materials processing.
Saved in:
| Title: | Combined wavelength and frequency modulation spectroscopy: a novel diagnostic tool for materials processing. |
|---|---|
| Authors: | Sun, H. C., Whittaker, E. A., Bae, Y. W. |
| Source: | Applied Optics; February 20 1993, Vol. 32, p885-893, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036935 |
|---|---|
| DOI: | 10.1364/AO.32.000885 |
