Interfacial oxide growth and filling-up behaviour of the micro-gap in silicon fusion bonding processes.

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Bibliographic Details
Title: Interfacial oxide growth and filling-up behaviour of the micro-gap in silicon fusion bonding processes.
Authors: Ju, B. K., Oh, M. H., Tchah, K. H.
Source: Journal of Materials Science; March 1 1993, Vol. 28, p1168-1174, 7p
Database: Applied Science & Technology Source
Description
ISSN:00222461
DOI:10.1007/BF01191948