Characterization of AZ PN114 resist for soft-x-ray projection lithography.

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Bibliographic Details
Title: Characterization of AZ PN114 resist for soft-x-ray projection lithography.
Authors: Early, K., Tennant, D. M., Jeon, D. Y.
Source: Applied Optics; December 1 1993, Vol. 32, p7044-7049, 6p
Database: Applied Science & Technology Source
Description
ISSN:00036935
DOI:10.1364/AO.32.007044