APA (7th ed.) Citation

Yanase, Y., Horie, H., & Oka, Y. (1994). Atomic force microscopy observation of Si(100) surface after hydrogen annealing. Journal of the Electrochemical Society, 141, 3259. https://doi.org/10.1149/1.2059315

Chicago Style (17th ed.) Citation

Yanase, Y., H. Horie, and Y. Oka. "Atomic Force Microscopy Observation of Si(100) Surface After Hydrogen Annealing." Journal of the Electrochemical Society 141 (1994): 3259. https://doi.org/10.1149/1.2059315.

MLA (9th ed.) Citation

Yanase, Y., et al. "Atomic Force Microscopy Observation of Si(100) Surface After Hydrogen Annealing." Journal of the Electrochemical Society, vol. 141, 1994, p. 3259, https://doi.org/10.1149/1.2059315.