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Atomic force microscopy observation of Si(100) surface after hydrogen annealing.

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Title: Atomic force microscopy observation of Si(100) surface after hydrogen annealing.
Authors: Yanase, Y., Horie, H., Oka, Y.
Source: Journal of the Electrochemical Society; November 1994, Vol. 141, p3259-3263, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500204457
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Atomic force microscopy observation of Si(100) surface after hydrogen annealing.
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  Data: <searchLink fieldCode="AU" term="%22Yanase%2C+Y%2E%22">Yanase, Y.</searchLink><br /><searchLink fieldCode="AU" term="%22Horie%2C+H%2E%22">Horie, H.</searchLink><br /><searchLink fieldCode="AU" term="%22Oka%2C+Y%2E%22">Oka, Y.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+Electrochemical+Society%22">Journal of the Electrochemical Society</searchLink>; November 1994, Vol. 141, p3259-3263, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500204457
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1149/1.2059315
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 5
        StartPage: 3259
    Titles:
      – TitleFull: Atomic force microscopy observation of Si(100) surface after hydrogen annealing.
        Type: main
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          Name:
            NameFull: Yanase, Y.
      – PersonEntity:
          Name:
            NameFull: Horie, H.
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            NameFull: Oka, Y.
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            – D: 01
              M: 11
              Text: November 1994
              Type: published
              Y: 1994
          Identifiers:
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              Value: 00134651
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            – Type: volume
              Value: 141
          Titles:
            – TitleFull: Journal of the Electrochemical Society
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