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Atomic force microscopy observation of Si(100) surface after hydrogen annealing.

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Bibliographic Details
Title: Atomic force microscopy observation of Si(100) surface after hydrogen annealing.
Authors: Yanase, Y., Horie, H., Oka, Y.
Source: Journal of the Electrochemical Society; November 1994, Vol. 141, p3259-3263, 5p
Database: Applied Science & Technology Source
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