Less expensive test pattern generation technique.
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| Title: | Less expensive test pattern generation technique. |
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| Authors: | Abd-El-Barr, M. H., McCrosky, C., Li, W. |
| Source: | IEE Proceedings -- Computers & Digital Techniques; January 1996, Vol. 143, p17-22, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 13502387 |
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| DOI: | 10.1049/ip-cdt:19960065 |
