Wear resistance of N+-implanted silicon investigated by scanning probe microscopy.

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Bibliographic Details
Title: Wear resistance of N+-implanted silicon investigated by scanning probe microscopy.
Authors: Miyamoto, T., Yokohata, T., Miyake, S.
Source: Journal of Tribology; October 1995, Vol. 117, p612-616, 5p
Database: Applied Science & Technology Source
Description
ISSN:07424787
DOI:10.1115/1.2831524