Miyamoto, T., Yokohata, T., & Miyake, S. (1995). Wear resistance of N+-implanted silicon investigated by scanning probe microscopy. Journal of Tribology, 117, 612. https://doi.org/10.1115/1.2831524
Chicago Style (17th ed.) CitationMiyamoto, T., T. Yokohata, and S. Miyake. "Wear Resistance of N+-implanted Silicon Investigated by Scanning Probe Microscopy." Journal of Tribology 117 (1995): 612. https://doi.org/10.1115/1.2831524.
MLA (9th ed.) CitationMiyamoto, T., et al. "Wear Resistance of N+-implanted Silicon Investigated by Scanning Probe Microscopy." Journal of Tribology, vol. 117, 1995, p. 612, https://doi.org/10.1115/1.2831524.
Warning: These citations may not always be 100% accurate.