Multibeamlet focusing of intense negative ion beams by an aperture displacement technique.

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Bibliographic Details
Title:	Multibeamlet focusing of intense negative ion beams by an aperture displacement technique.
Authors:	Takeiri, Y., Kaneko, O., Oka, Y.
Source:	Review of Scientific Instruments; November 1995, Vol. 66, p5236-5243, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	00346748
DOI:	10.1063/1.1146091