Takeiri, Y., Kaneko, O., & Oka, Y. (1995). Multibeamlet focusing of intense negative ion beams by an aperture displacement technique. Review of Scientific Instruments, 66, 5236. https://doi.org/10.1063/1.1146091
Chicago Style (17th ed.) CitationTakeiri, Y., O. Kaneko, and Y. Oka. "Multibeamlet Focusing of Intense Negative Ion Beams by an Aperture Displacement Technique." Review of Scientific Instruments 66 (1995): 5236. https://doi.org/10.1063/1.1146091.
MLA (9th ed.) CitationTakeiri, Y., et al. "Multibeamlet Focusing of Intense Negative Ion Beams by an Aperture Displacement Technique." Review of Scientific Instruments, vol. 66, 1995, p. 5236, https://doi.org/10.1063/1.1146091.
Warning: These citations may not always be 100% accurate.