Improved interferometer for measuring unsteady film thickness.

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Bibliographic Details
Title:	Improved interferometer for measuring unsteady film thickness.
Authors:	Nosoko, T., Mori, Y. H., Nagata, T.
Source:	Review of Scientific Instruments; August 1996, Vol. 67, p2685-2690, 6p
Database:	Applied Science & Technology Source

Description
ISSN:	00346748
DOI:	10.1063/1.1147095