Nosoko, T., Mori, Y. H., & Nagata, T. (1996). Improved interferometer for measuring unsteady film thickness. Review of Scientific Instruments, 67, 2685. https://doi.org/10.1063/1.1147095
Chicago Style (17th ed.) CitationNosoko, T., Y. H. Mori, and T. Nagata. "Improved Interferometer for Measuring Unsteady Film Thickness." Review of Scientific Instruments 67 (1996): 2685. https://doi.org/10.1063/1.1147095.
MLA (9th ed.) CitationNosoko, T., et al. "Improved Interferometer for Measuring Unsteady Film Thickness." Review of Scientific Instruments, vol. 67, 1996, p. 2685, https://doi.org/10.1063/1.1147095.
Warning: These citations may not always be 100% accurate.