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Improved interferometer for measuring unsteady film thickness.

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Bibliographic Details
Title: Improved interferometer for measuring unsteady film thickness.
Authors: Nosoko, T., Mori, Y. H., Nagata, T.
Source: Review of Scientific Instruments; August 1996, Vol. 67, p2685-2690, 6p
Database: Applied Science & Technology Source
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        Value: 10.1063/1.1147095
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 2685
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      – TitleFull: Improved interferometer for measuring unsteady film thickness.
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            NameFull: Nosoko, T.
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            NameFull: Mori, Y. H.
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              Text: August 1996
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              Y: 1996
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              Value: 67
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