Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.
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| Title: | Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure. |
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| Authors: | Guthrie, D. K., First, P. N., Gaylord, T. K. |
| Source: | Applied Physics Letters; July 12 1999, Vol. 75 Issue 2, p283-285, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.124349 |
