APA (7th ed.) Citation

Guthrie, D. K., First, P. N., & Gaylord, T. K. (1999). Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure. Applied Physics Letters, 75(2), 283. https://doi.org/10.1063/1.124349

Chicago Style (17th ed.) Citation

Guthrie, D. K., P. N. First, and T. K. Gaylord. "Ballistic-electron-emission-spectroscopy Detection of Monolayer Thickness Fluctuations in a Semiconductor Heterostructure." Applied Physics Letters 75, no. 2 (1999): 283. https://doi.org/10.1063/1.124349.

MLA (9th ed.) Citation

Guthrie, D. K., et al. "Ballistic-electron-emission-spectroscopy Detection of Monolayer Thickness Fluctuations in a Semiconductor Heterostructure." Applied Physics Letters, vol. 75, no. 2, 1999, p. 283, https://doi.org/10.1063/1.124349.