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Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.

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Bibliographic Details
Title: Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.
Authors: Guthrie, D. K., First, P. N., Gaylord, T. K.
Source: Applied Physics Letters; July 12 1999, Vol. 75 Issue 2, p283-285, 3p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; July 12 1999, Vol. 75 Issue 2, p283-285, 3p
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        Value: 10.1063/1.124349
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        Text: English
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        StartPage: 283
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      – TitleFull: Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.
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              Text: July 12 1999
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