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Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.

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Bibliographic Details
Title: Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure.
Authors: Guthrie, D. K., First, P. N., Gaylord, T. K.
Source: Applied Physics Letters; July 12 1999, Vol. 75 Issue 2, p283-285, 3p
Database: Applied Science & Technology Source
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