10 nm scale electron beam lithography using a triphenylene derivative as a negative/positive tone resist.

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Bibliographic Details
Title: 10 nm scale electron beam lithography using a triphenylene derivative as a negative/positive tone resist.
Authors: Robinson, A. P. G., Palmer, R. E., Tada, T.
Source: Journal of Physics: D Applied Physics; August 21 1999, Vol. 32 Issue 16, pL75-L78, 4p
Database: Applied Science & Technology Source
Description
ISSN:00223727