In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate.
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| Title: | In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. |
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| Authors: | Dehm, Gerhard, Arzt, Eduard |
| Source: | Applied Physics Letters; August 21 2000, Vol. 77 Issue 8, p1126-1128, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.1289488 |
