APA (7th ed.) Citation

Dehm, G., & Arzt, E. (2000). In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. Applied Physics Letters, 77(8), 1126. https://doi.org/10.1063/1.1289488

Chicago Style (17th ed.) Citation

Dehm, Gerhard, and Eduard Arzt. "In Situ Transmission Electron Microscopy Study of Dislocations in a Polycrystalline Cu Thin Film Constrained by a Substrate." Applied Physics Letters 77, no. 8 (2000): 1126. https://doi.org/10.1063/1.1289488.

MLA (9th ed.) Citation

Dehm, Gerhard, and Eduard Arzt. "In Situ Transmission Electron Microscopy Study of Dislocations in a Polycrystalline Cu Thin Film Constrained by a Substrate." Applied Physics Letters, vol. 77, no. 8, 2000, p. 1126, https://doi.org/10.1063/1.1289488.