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In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate.

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Title: In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate.
Authors: Dehm, Gerhard, Arzt, Eduard
Source: Applied Physics Letters; August 21 2000, Vol. 77 Issue 8, p1126-1128, 3p
Database: Applied Science & Technology Source
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  Data: In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate.
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  Data: <searchLink fieldCode="AU" term="%22Dehm%2C+Gerhard%22">Dehm, Gerhard</searchLink><br /><searchLink fieldCode="AU" term="%22Arzt%2C+Eduard%22">Arzt, Eduard</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; August 21 2000, Vol. 77 Issue 8, p1126-1128, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500615216
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        Value: 10.1063/1.1289488
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 1126
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      – TitleFull: In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate.
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            NameFull: Dehm, Gerhard
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              Text: August 21 2000
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              Y: 2000
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