Correlation of defect profiles with carrier profiles of InAs epilayers on GaP.
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| Title: | Correlation of defect profiles with carrier profiles of InAs epilayers on GaP. |
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| Authors: | Tsukamoto, H., Chen, E.-H., Woodall, J. M. |
| Source: | Applied Physics Letters; February 12 2001, Vol. 78 Issue 7, p952-954, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.1338956 |
