Statistical analysis of multiple cracking phenomenon of a SiOx thin film on a polymer substrate.
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| Title: | Statistical analysis of multiple cracking phenomenon of a SiOx thin film on a polymer substrate. |
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| Authors: | Yanaka, M., Tsukahara, Y., Okabe, T. |
| Source: | Journal of Applied Physics; July 15 2001, Vol. 90 Issue 2, p713-719, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1379355 |
