APA (7th ed.) Citation

Yanaka, M., Tsukahara, Y., & Okabe, T. (2001). Statistical analysis of multiple cracking phenomenon of a SiOx thin film on a polymer substrate. Journal of Applied Physics, 90(2), 713. https://doi.org/10.1063/1.1379355

Chicago Style (17th ed.) Citation

Yanaka, M., Y. Tsukahara, and T. Okabe. "Statistical Analysis of Multiple Cracking Phenomenon of a SiOx Thin Film on a Polymer Substrate." Journal of Applied Physics 90, no. 2 (2001): 713. https://doi.org/10.1063/1.1379355.

MLA (9th ed.) Citation

Yanaka, M., et al. "Statistical Analysis of Multiple Cracking Phenomenon of a SiOx Thin Film on a Polymer Substrate." Journal of Applied Physics, vol. 90, no. 2, 2001, p. 713, https://doi.org/10.1063/1.1379355.