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Statistical analysis of multiple cracking phenomenon of a SiOx thin film on a polymer substrate.

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Bibliographic Details
Title: Statistical analysis of multiple cracking phenomenon of a SiOx thin film on a polymer substrate.
Authors: Yanaka, M., Tsukahara, Y., Okabe, T.
Source: Journal of Applied Physics; July 15 2001, Vol. 90 Issue 2, p713-719, 7p
Database: Applied Science & Technology Source
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