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Influence of the elastic strain on the band structure of ellipsoidal SiGe coherently embedded in the Si matrix.

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Bibliographic Details
Title: Influence of the elastic strain on the band structure of ellipsoidal SiGe coherently embedded in the Si matrix.
Authors: Usami, Noritaka, Ichitsubo, Tetsu, Ujihara, Toru
Source: Journal of Applied Physics; July 15 2003, Vol. 94 Issue 2, p916-920, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500870052
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Influence of the elastic strain on the band structure of ellipsoidal SiGe coherently embedded in the Si matrix.
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  Data: <searchLink fieldCode="AU" term="%22Usami%2C+Noritaka%22">Usami, Noritaka</searchLink><br /><searchLink fieldCode="AU" term="%22Ichitsubo%2C+Tetsu%22">Ichitsubo, Tetsu</searchLink><br /><searchLink fieldCode="AU" term="%22Ujihara%2C+Toru%22">Ujihara, Toru</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; July 15 2003, Vol. 94 Issue 2, p916-920, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500870052
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.1580194
    Languages:
      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 916
    Titles:
      – TitleFull: Influence of the elastic strain on the band structure of ellipsoidal SiGe coherently embedded in the Si matrix.
        Type: main
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          Name:
            NameFull: Usami, Noritaka
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            NameFull: Ichitsubo, Tetsu
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            NameFull: Ujihara, Toru
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            – D: 15
              M: 07
              Text: July 15 2003
              Type: published
              Y: 2003
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              Value: 94
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              Value: 2
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            – TitleFull: Journal of Applied Physics
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