Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.
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| Title: | Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers. |
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| Authors: | Kita, T., Kakutani, T., Wada, O. |
| Source: | Journal of Applied Physics; November 15 2003, Vol. 94 Issue 10, p6487-6490, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1623327 |
