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Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.

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Bibliographic Details
Title: Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.
Authors: Kita, T., Kakutani, T., Wada, O.
Source: Journal of Applied Physics; November 15 2003, Vol. 94 Issue 10, p6487-6490, 4p
Database: Applied Science & Technology Source
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