Inspection of micro-solderballs on a semiconductor bumped wafer using optical shadowgraph.
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| Title: | Inspection of micro-solderballs on a semiconductor bumped wafer using optical shadowgraph. |
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| Authors: | Tay, C. J., Wang, S. H., Quan, C. |
| Source: | Optical Engineering; Apr2004, Vol. 43 Issue 4, p963-970, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00913286 |
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| DOI: | 10.1117/1.1668284 |
