Focused Ion Beam Milling: A Practical Method for Preparing Cast Al-Si Alloy Samples for Transmission Electron Microscopy.

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Bibliographic Details
Title:	Focused Ion Beam Milling: A Practical Method for Preparing Cast Al-Si Alloy Samples for Transmission Electron Microscopy.
Authors:	Shankar, S., Riddle, Y. W., Makhloup, M. M.
Source:	Metallurgical & Materials Transactions. Part A; Mar2003, Vol. 34A, p705-707, 3p
Database:	Applied Science & Technology Source

Description
ISSN:	10735623
DOI:	10.1007/s11661-003-0105-1