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Focused Ion Beam Milling: A Practical Method for Preparing Cast Al-Si Alloy Samples for Transmission Electron Microscopy.

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Title: Focused Ion Beam Milling: A Practical Method for Preparing Cast Al-Si Alloy Samples for Transmission Electron Microscopy.
Authors: Shankar, S., Riddle, Y. W., Makhloup, M. M.
Source: Metallurgical & Materials Transactions. Part A; Mar2003, Vol. 34A, p705-707, 3p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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  Data: Focused Ion Beam Milling: A Practical Method for Preparing Cast Al-Si Alloy Samples for Transmission Electron Microscopy.
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        Value: 10.1007/s11661-003-0105-1
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        Text: English
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      – TitleFull: Focused Ion Beam Milling: A Practical Method for Preparing Cast Al-Si Alloy Samples for Transmission Electron Microscopy.
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              Text: Mar2003
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