Determination of the refractive indices of AlN, GaN, and AlxGa1-xN grown on (111)Si substrates.

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Bibliographic Details
Title: Determination of the refractive indices of AlN, GaN, and AlxGa1-xN grown on (111)Si substrates.
Authors: Antoine-Vincent, N., Natali, F., Mihailovic, M.
Source: Journal of Applied Physics; May 1 2003, Vol. 93 Issue 9, p5222-5226, 5p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.1563293