APA (7th ed.) Citation

Antoine-Vincent, N., Natali, F., & Mihailovic, M. (2003). Determination of the refractive indices of AlN, GaN, and AlxGa1-xN grown on (111)Si substrates. Journal of Applied Physics, 93(9), 5222. https://doi.org/10.1063/1.1563293

Chicago Style (17th ed.) Citation

Antoine-Vincent, N., F. Natali, and M. Mihailovic. "Determination of the Refractive Indices of AlN, GaN, and AlxGa1-xN Grown on (111)Si Substrates." Journal of Applied Physics 93, no. 9 (2003): 5222. https://doi.org/10.1063/1.1563293.

MLA (9th ed.) Citation

Antoine-Vincent, N., et al. "Determination of the Refractive Indices of AlN, GaN, and AlxGa1-xN Grown on (111)Si Substrates." Journal of Applied Physics, vol. 93, no. 9, 2003, p. 5222, https://doi.org/10.1063/1.1563293.