Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy.
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| Title: | Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy. |
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| Authors: | Ng, C. Y., Lim, V. S. W., Chen, T. P. |
| Source: | Applied Physics Letters; 10/4/2004, Vol. 85 Issue 14, p2941-2943, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.1801675 |
