Magnetoresistance characterization of nanometer Si metal-oxide-semiconductor transistors.
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| Title: | Magnetoresistance characterization of nanometer Si metal-oxide-semiconductor transistors. |
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| Authors: | Meziani, Y. M., Łusakowski, J., Knap, W. |
| Source: | Journal of Applied Physics; 11/15/2004, Vol. 96 Issue 10, p5761-5765, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1806991 |
