Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique.
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| Title: | Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique. |
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| Authors: | Kawado, S., Taishi, T., Iida, S. |
| Source: | Journal of Physics: D Applied Physics; May 21 2005, Vol. 38, pA17-A22, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00223727 |
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| DOI: | 10.1088/0022-3727/38/10A/004 |
