APA (7th ed.) Citation

Kawado, S., Taishi, T., & Iida, S. (2005). Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique. Journal of Physics: D Applied Physics, 38, A17. https://doi.org/10.1088/0022-3727/38/10A/004

Chicago Style (17th ed.) Citation

Kawado, S., T. Taishi, and S. Iida. "Three-dimensional Structure of Dislocations in Silicon Determined by Synchrotron White X-ray Topography Combined with a Topo-tomographic Technique." Journal of Physics: D Applied Physics 38 (2005): A17. https://doi.org/10.1088/0022-3727/38/10A/004.

MLA (9th ed.) Citation

Kawado, S., et al. "Three-dimensional Structure of Dislocations in Silicon Determined by Synchrotron White X-ray Topography Combined with a Topo-tomographic Technique." Journal of Physics: D Applied Physics, vol. 38, 2005, p. A17, https://doi.org/10.1088/0022-3727/38/10A/004.